Electron microscopy lab for GeoMaterials

  • EPMA-JEOL iSP100
  • FEG-SEM JEOL JSM-IT800 with EBDS system

Electron probe microanalyzer (EPMA)

JEOL SuperProbe JXA-iSP100
equipped with
– Tungsten-filament or LaB6
– 5 Wavelength dispersive crystal spectrometers:
            One 4-crystal spectrometer:
                        TAP + LiF + LDE1 + LDEB
            Four double crystal L-Type spectrometers:
                        LiFL  + PETL
                        LiFL  + PETL
                        TAPL + PETL
                        TAPL + PETL
– Energy Dispersive Spectroscopy (EDS) system, 30 mm² detector (with live view)
– Cathodoluminescence detector

Schottky emitter – Scanning electron microscope (FEG-SEM) with EBSD system


equipped with

– In-lens Schottky emitter (FEG)
– Electron Backscatter Diffraction (EBSD) detector (Oxford Instruments, Symmetry 2)
– Energy Dispersive Spectroscopy (EDS) system (Oxford Instruments, Ultim Max 100 mm²)
– High vacuum SE and 6-sector BSE detectors
– Low-vacuum system (with SE and BSE detectors)
– Eucentric 5-axes stage (x / y / z / tilt / rotate)
– Sample size up to  100*100*50 mm